JOURNEY TO DATA QUALITY (THE MIT PRESS) By Yang W. Lee & Leo L. Pipino **Mint**
JOURNEY TO DATA QUALITY (THE MIT PRESS) By Yang W. Lee & Leo L. Pipino & Richard Y. Wang & James D. Funk **Mint Condition**.
Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang,
Publisher : The MIT Press. Publication Date : Aug 21 2009.